Produkter » Materialkarakterisering » Scanning Electron Microscopy-sv » New Product Category-sv » Phenom XL

The next-generation Thermo Scientific Phenom XL G2 Desktop Scanning Electron Microscope (SEM) automates your quality control process, providing accurate, reproducible results while freeing up time for value-added work. 

Meet quality standards with an intuitive, automated solution that eliminates manual, repetitive tasks:

  • Obtain the quality information you need to discover failures early and rapidly adjust your production process when needed.
  • Automate quality control to process a high volume of samples with fewer chances of human error.
  • Get up to speed quickly with an all-new, easy-to-learn interface ideal for a wide range of applications.

The Phenom XL G2 Desktop SEM features full-screen images and an average time-to image of 60 seconds. The unique CeBelectron source offers a long lifetime with less maintenance. The small form factor requires little lab space, allowing you to place the microscope exactly where you need it.

Specifications

Electron optical
  • Long lifetime thermionic source (CeB6 )
  • Multiple beam currents
Electron optical magnification range
  • 160 - 200,000x
Light optical magnification
  • 3–16x
Resolution
  • <10 nm
Image resolution options
  • 960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels
Acceleration voltages
  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum levels
  • Low - medium - high
Detector
  • Backscattered electron detector (standard)
  • Secondary electron detector (optional)
  • Energy-dispersive X-ray spectroscopy (EDS) detector (optional)
Sample size
  • Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
  • Max. 40 mm (h)
Sample loading time
  • Light optical <5 s 
  • Electron optical <60 s