SEM for forensics applications2016-05-10
Phenom desktop scanning electron microscopes (SEM) are used for general forensic investigation and analysis, and in specific areas such as ballistics. Many kinds of microscopic evidence can be obtained from fabrics, metals, textiles or glass, while the SEM and its accessories can also be used to identify scratches and indents on objects.
The Phenom combines the high magnification of electron microscopy with the ease of use of optical microscopy.
With magnifications up to 130,000x and integrated EDS analysis, the use of desktop SEM in the forensic market can be of great value.