New AFM/Raman Spectroscopy System2013-05-15
Agilent Technologies Inc. (NYSE: A) today announced the availability of a high-performance AFM/Raman system for life science and materials science applications. The system seamlessly integrates the Agilent 6000ILM AFM (atomic force microscope) and a HORIBA XploRA INV (inverted Raman microscope). The combination enables researchers to go beyond the optical diffraction limit to achieve nanoscale resolution as they perform Raman spectroscopy.
"Key capabilities of this new high-precision system include AFM/Raman co-localization, tip-enhanced Raman spectroscopy for transparent samples, and AFM force-volume spectroscopy," said Jeff Jones, general manager for Agilent's nanoinstrumentation facility in Chandler, Ariz. "It's an ideal solution for advanced life science research, including studies of cell membranes, the surface structure of cells, individual proteins, single molecules, and biopolymers, as well as for investigating novel materials such as graphene."
AFM/Raman co-localization can be performed either sequentially, using the new system's Raman laser scanning option, or simultaneously, using Agilent PicoView software to control the system. Raman mapping is achieved by acquiring a complete Raman spectrum at each pixel of a 2-D image to create a detailed chemical image of the sample. This image is generated by plotting the peak intensity (material concentration), peak position (molecular structure or material stress), or peak width (crystallinity). The system precisely overlays the detailed chemical image with a 3-D AFM topography image.