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Phenom ParticleX TC desktop SEM

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With the growing demand for analysis of smaller particles beyond the scope of light microscopy within (automotive) industries, the Thermo Scientific™ Phenom™ ParticleX - Technical Cleanliness enables automated Scanning Electron Microscopy with EDX Spectrometry.

This is a major advantage over light microscopy as it enables chemical classification of the particles, providing great insights in your production processes and/or environments.

Download the ParticleX TC specification sheet and learn more about: 

  • Automatically analyzing industry standard 47 mm filters
  • Setting specific parameters like particle size range, chemical classification rules, area of interest and stop criteria for your application
  • Creating reports according to automotive industry standards 

Phenom Particle X not only provides high quality SEM analysis, it is also designed to perform a number of specific functions. These include:

  • Particle analysis of metal powders at the microscale for the additive industry
  • Confirming that components fulfill technical cleanliness specifications according to VDA19 or ISO16232 standards.

All now made possible in-house and on your desktop.

 
Phenom ParticleX TC

Light optical magnification

3 - 16x

Electron optical magnification range

80 - 100,000x

Resolution

< 14 nm

Digital zoom

Max. 12x

Light optical navigation camera

Color

Acceleration voltages

Default: 5 kV, 10 kV and 15 kV 
Advanced mode: adjustable range between 4,8 kV and 20,5 kV imaging and analysis mode Secondary Electron Detector

Vacuum modes

Standard mode
Charge reduction mode
High vacuum mode

Detector

BSD
EDS (optional)
SED (optional)

Sample size

Max. 100 mm x 100 mm
Up to 36x 12mm pin stubs

Sample height

Max. 65 mm