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Phenom ParticleX AM Desktop SEM

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The Thermo Scientific™ Phenom™ ParticleX Scanning Electron Microscope (SEM) for Additive Manufacturing. The Phenom ParticleX AM Desktop SEM is a multi-purpose desktop SEM delivering purity at the microscale.

Take in-house control of your data:

  • Monitor critical characteristics of metal powders
  • Suited for powder-bed and powder-fed additive manufacturing processes
  • Identify particle size distributions, individual particle morphology, and foreign particles

It is equipped with a chamber that allows the analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput.

A growing number of manufacturing companies are establishing scanning electron microscopy (SEM) systems in-house. This trend, from outsourcing to in-house analysis, is growing and the benefits, such as the ability to perform a broad range of automated desktop analyses, chemical classification and verification according to specific norms are clear. The system is automated and offers multiple sample analysis, making testing and classification up to 10 times faster, giving certainty within one day. 

The Phenom ParticleX Desktop SEM not only provides high quality SEM analysis, it is also designed to perform a number of specific functions. These include particle analysis of metal powders at the microscale for the additive industry, and confirming that components fulfill technical cleanliness specifications according to VDA19 or ISO16232 standards. All now made possible in-house and on your desktop.

 
Phenom ParticleX AM

Light optical magnification

3 - 16x

Electron optical magnification range

80 - 100,000x

Resolution

< 14 nm

Digital zoom

Max. 12x

Light optical navigation camera

Color

Acceleration voltages

Default: 5 kV, 10 kV and 15 kV 
Advanced mode: adjustable range between 4,8 kV and 20,5 kV imaging and analysis mode Secondary Electron Detector

Vacuum modes

Standard mode
Charge reduction mode
High vacuum mode

Detector

BSD
EDS (optional)
SED (optional)

Sample size

Max. 100 mm x 100 mm
Up to 36x 12mm pin stubs

Sample height

Max. 65 mm