News » Phenom Webinar: Delphi - a new approach to CLEM

Phenom Webinar: Delphi - a new approach to CLEM

2017-01-23

Date and time:

Friday, February 3, 2017 10:00 am 
Europe Time (Amsterdam, GMT+01:00) 

Duration:

1 Hour

Description

Delphi is the world's first fully integrated CLEM solution that enables fast correlative microscopy with unique overlay precision.
The system is extremely easy to use for both light- and electron-microscopy users. Even more importantly, Delphi opens the door to these techniques for all laboratories through a cost-efficient package that does not require experienced microscopy skills to image and interpret data.

We will introduce you into CLEM as well as the system and will show you how easy you can achieve correlated images.

 

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