XRF

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X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent)  X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials and for research in geochemistry, forensic science and archaeology.

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Micro-XRF Analysis (XGT)

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Ramin Lindqvist
Ramin Lindqvist
Product Manager
Mobile: +358 (0)400 570 760
ramin.lindqvist@gammadatafinland.fi

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» New Plasma Profiling TOFMS™ from Horiba » Handheld XRF Analyser now available with integrated camera

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