Recent legislation in most countries has banned the use of heavy metals which has a big impact on the semiconductor industry. The removal of the lead from the solder of semiconductor devices can cause and expedite the growth of tin whiskers leading to the growth of these crystalline structures creating a potential source of electrical shorting in chips causing system failures in computers, cell phones, missiles, and satellites.
The Phenom SEM provides an excellent tool for the inspection of semiconductors and a multitude of electronic compnents. Its unique navigation capabilities makes it easy to locate different elements, and the online measurement tool makes it possible to measure these on the spot. The Micro-electronics insert (pictured above) is designed to minimize sample preparation time, without glue or adhesive, no scratching or contaminating the sample and instant preparation and loading.